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Journal Articles

Evaluation of transient current induced by high energy charged particles in Si PIN photodiode

Onoda, Shinobu; Hirao, Toshio; Laird, J. S.; Wakasa, Takeshi; Yamakawa, Takeshi; Okamoto, Tsuyoshi*; Koizumi, Yoshiharu*; Kamiya, Tomihiro; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.173 - 176, 2004/10

no abstracts in English

Journal Articles

An Automated single ion hit at JAERI heavy ion microbeam to observe individual radiation damage

Kamiya, Tomihiro; Sakai, Takuro; *; *; Hirao, Toshio

Nuclear Instruments and Methods in Physics Research B, 158(1-4), p.255 - 259, 1999/00

https://doi.org/10.1016/S0168-583X(99)00325-0
 Times Cited Count：6 Percentile：46.7(Instruments & Instrumentation)

no abstracts in English

JAEA Reports

Electron temperature profile measurement using the filter absorption method in JT-60

Nagashima, Keisuke; Nishitani, Takeo; Takeuchi, Hiroshi

JAERI-M 89-226, 23 Pages, 1990/01

JAERI-M-89-226.pdf:0.53MB

no abstracts in English

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